Bi2Sr2CaCu2O8+δ intrinsic Josephson junctions: Surface layer characterization 
and control

Zhao, S. P.; Zhu, X. B.; Wei, Y. F.; Chen, G. H.; Yang, Q. S.; Lin, C. T.

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Bi₂Sr₂CaCu₂O_8+δ intrinsic Josephson junctions: Surface layer characterization and control

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Lin, C. T.
Scientific Facility Crystal Growth (Masahiko Isobe), Max Planck Institute for Solid State Research, Max Planck Society;

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Zhao, S. P., Zhu, X. B., Wei, Y. F., Chen, G. H., Yang, Q. S., & Lin, C. T. (2005). Bi₂Sr₂CaCu₂O_8+δ intrinsic Josephson junctions: Surface layer characterization and control. Physical Review B, 72(18): 184511.

Cite as: https://hdl.handle.net/21.11116/0000-000F-00DD-8

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