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Dielectric and conductivity studies on lead silicate glasses having mixed alkali and alkaline earth metal oxides

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Balaya,  P.
Department Physical Chemistry of Solids (Joachim Maier), Max Planck Institute for Solid State Research, Max Planck Society;

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Citation

Balaya, P., Shrikhande, V. K., Kothiyal, G. P., & Goyal, P. S. (2004). Dielectric and conductivity studies on lead silicate glasses having mixed alkali and alkaline earth metal oxides. Current Science, 86(4), 553-556.


Cite as: https://hdl.handle.net/21.11116/0000-000E-FEB4-9
Abstract
Lead silicate glasses containing different amounts of Na2O and K2O
along with BaO were prepared by conventional melt and quench method.
Dielectric constant and its dispersion were investigated as a function
of frequency over the range 10 kHz to 5 MHz at room temperature. Ionic
conductivity was studied on three selected mixed alkali glasses
(Na2O)(0.069) - (K2O)(0.036) - (BaO)(0.026) - (PbO)(0.11) -
(SiO2)(0.76) (LS31), (Na2O)(0.066) - (K2O)(0.07) - (BaO)(0.021) -
(PbO)(0.106) - (SiO2)(0.736) (LS1) and (Na2O)(0.062) - (K2O)(0.013) -
(BaO)(0.02) - (PbO)(0.099) - (SiO2)(0.689) (LS33) as a function of
frequency over the range 100 Hz to 500 kHz in the temperature interval
25-380degreesC in vacuum of 10(-2) mbar. Both DC conductivity and the
hopping frequency, inferred from the analysis of AC conductivity data,
exhibit Arrhenius behaviour with temperature. Unlike the conventional
mixed alkali system, in the present glass system, it is found that the
activation energies associated with DC conduction (E-sigma) and that of
hopping process (E-h) for LS1, having nearly equal amounts of Na+ and
K+ ions, are found to be less compared to those for glasses LS31 and
LS33. E-sigma (1.14 eV) calculated for LS1 using Anderson-Stuart model
agrees well with that obtained experimentally (1.18 eV). The above
behaviour observed in E-sigma and E-h for the present glass system may
be attributed to the complex effect due to both mixed alkali effect and
the structural changes introduced by the change in SiO2 content.