Enhanced flux line pinning by substrate induced defects in YBCO thin films

Albrecht, J.; Leonhardt, S.; Habermeier, H.-U.; Bruck, S.; Spolenak, R.; Kronmüller, H.

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Enhanced flux line pinning by substrate induced defects in YBCO thin films

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Albrecht, J.
Scientific Facility Thin Film Technology (Gennady Logvenov), Max Planck Institute for Solid State Research, Max Planck Society;

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Leonhardt, S.
Scientific Facility Thin Film Technology (Gennady Logvenov), Max Planck Institute for Solid State Research, Max Planck Society;

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Habermeier, H.-U.
Scientific Facility Thin Film Technology (Gennady Logvenov), Max Planck Institute for Solid State Research, Max Planck Society;
Department Solid State Spectroscopy (Bernhard Keimer), Max Planck Institute for Solid State Research, Max Planck Society;
Department Physical Chemistry of Solids (Joachim Maier), Max Planck Institute for Solid State Research, Max Planck Society;

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Citation

Albrecht, J., Leonhardt, S., Habermeier, H.-U., Bruck, S., Spolenak, R., & Kronmüller, H. (2004). Enhanced flux line pinning by substrate induced defects in YBCO thin films. Physica C, 404(1-4), 18-21.

Cite as: https://hdl.handle.net/21.11116/0000-000E-FF04-F

Abstract

The critical current density of YBa2Cu3O7-delta (YBCO) thin films
strongly depends on the surface properties of the substrate. We modify
the surface of SrTiO3 single crystalline substrates using a 30 keV
focussed beam of gallium ions. After characterizing the created
patterns on the substrate by atomic force microscopy, thin films of
optimally doped YBCO are deposited by pulsed laser deposition. By means
of quantitative magnetooptical measurements it is found that a proper
irradiation process can enhance the critical current density of the
deposited superconducting film. The film growth on the irradiated
substrate can lead to a higher and controlled defect density and thus
to a modified distribution of effective flux line pinning sites in the
superconductor. (C) 2004 Elsevier B.V. All rights reserved.