Far-infrared ellipsometry using a synchrotron light source - the dielectric 
response of the cuprate high Tc superconductors

Bernhard, C.; Humlíček, J.; Keimer, B.

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Far-infrared ellipsometry using a synchrotron light source - the dielectric response of the cuprate high T_c superconductors

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Bernhard, C.
Department Solid State Spectroscopy (Bernhard Keimer), Max Planck Institute for Solid State Research, Max Planck Society;

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Keimer, B.
Department Solid State Spectroscopy (Bernhard Keimer), Max Planck Institute for Solid State Research, Max Planck Society;

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Citation

Bernhard, C., Humlíček, J., & Keimer, B. (2004). Far-infrared ellipsometry using a synchrotron light source - the dielectric response of the cuprate high T_c superconductors. Thin Solid Films, 455-456, 143-149.

Cite as: https://hdl.handle.net/21.11116/0000-000E-FE88-B

Abstract

We describe the setup of an ellipsometer for the far- to mid-infrared
(FIR-MIR) spectral range that is used in combination with a
Fourier-transform infrared (FTIR) spectrometer and a synchrotron light
source. We present the outline of the ellipsometer and discuss how it
has been optimized in order to perform accurate ellipsometric
measurements on relatively small single crystals of the cuprate
high-T-c superconductors (HTSC) and other oxide based compounds with
strongly correlated charge carriers. We present ellipsometric spectra
for the HTSC compounds B2Sr2CaCu2O8+delta, and YBa2Cu3O6.95. (C) 2004
Elsevier B.V. All rights reserved.