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Journal Article

LaCaMnO3 thin film laser energy/power meter

MPS-Authors
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Zhang,  P. X.
Scientific Facility Thin Film Technology (Gennady Logvenov), Max Planck Institute for Solid State Research, Max Planck Society;
Scientific Facility Crystal Growth (Masahiko Isobe), Max Planck Institute for Solid State Research, Max Planck Society;

/persons/resource/persons280635

Wang,  C.
Department Physical Chemistry of Solids (Joachim Maier), Max Planck Institute for Solid State Research, Max Planck Society;

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Zhang,  G. Y.
Scientific Facility Crystal Growth (Masahiko Isobe), Max Planck Institute for Solid State Research, Max Planck Society;

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Yu,  L.
Department Solid State Spectroscopy (Bernhard Keimer), Max Planck Institute for Solid State Research, Max Planck Society;
Scientific Facility Thin Film Technology (Gennady Logvenov), Max Planck Institute for Solid State Research, Max Planck Society;

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Habermeier,  H.-U.
Scientific Facility Thin Film Technology (Gennady Logvenov), Max Planck Institute for Solid State Research, Max Planck Society;
Department Solid State Spectroscopy (Bernhard Keimer), Max Planck Institute for Solid State Research, Max Planck Society;
Department Physical Chemistry of Solids (Joachim Maier), Max Planck Institute for Solid State Research, Max Planck Society;

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Citation

Zhang, P. X., Wang, C., Zhang, G. Y., Yu, L., Lee, W. K., & Habermeier, H.-U. (2004). LaCaMnO3 thin film laser energy/power meter. Optics & Laser Technology, 36(4), 341-343.


Cite as: https://hdl.handle.net/21.11116/0000-000E-FB23-0
Abstract
A prototype laser energy/power meter was designed based on the
anisotropic Seebeck effect of LaCaMnO3 thin film grown on vicinal cut
LaAlO3 substrate. The optical response of this device to the pulsed
laser and the chopped CW laser was measured from infrared to
ultraviolet. The peak voltage of the measured signal shows a good
linear relation to the laser energy and power in the measured range. It
was shown that at 1064 nm wavelength, this prototype device
demonstrates higher sensitivity than that of commercial device. (C)
2003 Elsevier Ltd. All rights reserved.