Temperature dependence of structural parameters in oxide-ion-conducting Nd9.33
(SiO4)6O2: single crystal X-ray studies from 295 to 900 K

Okudera, H.; Yoshiasa, A.; Masubuchi, Y.; Higuchi, M.; Kikkawa, S.

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Temperature dependence of structural parameters in oxide-ion-conducting Nd_9.33(SiO₄)₆O₂: single crystal X-ray studies from 295 to 900 K

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Okudera, H.
Former Departments, Max Planck Institute for Solid State Research, Max Planck Society;

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Okudera, H., Yoshiasa, A., Masubuchi, Y., Higuchi, M., & Kikkawa, S. (2004). Temperature dependence of structural parameters in oxide-ion-conducting Nd_9.33(SiO₄)₆O₂: single crystal X-ray studies from 295 to 900 K. Journal of Solid State Chemistry, 177(12), 4451-4458.

Cite as: https://hdl.handle.net/21.11116/0000-000E-F877-5

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