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Journal Article

The X-ray characterization of Bi2Sr2CaCu2O8+x single crystals grown by different methods

MPS-Authors
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Maljuk,  A. N.
Scientific Facility Crystal Growth (Masahiko Isobe), Max Planck Institute for Solid State Research, Max Planck Society;

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Kulakov,  A. B.
Scientific Facility Crystal Growth (Masahiko Isobe), Max Planck Institute for Solid State Research, Max Planck Society;

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Lin,  C. T.
Scientific Facility Crystal Growth (Masahiko Isobe), Max Planck Institute for Solid State Research, Max Planck Society;

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Citation

Bdikin, I. K., Maljuk, A. N., Kulakov, A. B., Lin, C. T., Kumar, P., Kumar, B., et al. (2003). The X-ray characterization of Bi2Sr2CaCu2O8+x single crystals grown by different methods. Physica C, 383(4), 431-437.


Cite as: https://hdl.handle.net/21.11116/0000-000E-F8E9-4
Abstract
We report on results of systematic X-ray investigations of the
Bi2Sr2CaCU2O8+x (2212) single crystals grown by slow cooling,
top seeded solution growth and travelling solvent floating zone
(TSFZ) methods. The typical concentrations of dislocations in
the Bi-2212 crystals are estimated from width of peaks.
According to the obtained X-ray topography and diffractometry
data, these crystals demonstrate misorientation anisotropy
around different crystallographic axes, which is a consequence
of incommensurate modulation in this compound. The highly
perfect crystals grown by TSFZ method are found to demonstrate
the abnormal transmission X-ray diffraction effect (Borrman
effect). (C) 2002 Elsevier Science B.V. All rights reserved.