Scanning tunneling microscopy and x-ray photoelectron diffraction investigation 
of C60 films on Cu(100)

Abel, M.; Dmitriev, A.; Fasel, R.; Lin, N.; Barth, J. V.; Kern, K.

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Scanning tunneling microscopy and x-ray photoelectron diffraction investigation of C₆₀ films on Cu(100)

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Abel, M.
Department Nanoscale Science (Klaus Kern), Max Planck Institute for Solid State Research, Max Planck Society;

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Dmitriev, A.
Department Nanoscale Science (Klaus Kern), Max Planck Institute for Solid State Research, Max Planck Society;

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Lin, N.
Department Nanoscale Science (Klaus Kern), Max Planck Institute for Solid State Research, Max Planck Society;

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Barth, J. V.
Former Research Groups, Max Planck Institute for Solid State Research, Max Planck Society;
Department Nanoscale Science (Klaus Kern), Max Planck Institute for Solid State Research, Max Planck Society;

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Kern, K.
Department Nanoscale Science (Klaus Kern), Max Planck Institute for Solid State Research, Max Planck Society;

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Abel, M., Dmitriev, A., Fasel, R., Lin, N., Barth, J. V., & Kern, K. (2003). Scanning tunneling microscopy and x-ray photoelectron diffraction investigation of C₆₀ films on Cu(100). Physical Review B, 67(24): 245407.

Cite as: https://hdl.handle.net/21.11116/0000-000E-F147-2

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