Reconstruction and epitaxial adlayers on SiC surfaces: Structural significance 
for technological application

Starke, U.

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Reconstruction and epitaxial adlayers on SiC surfaces: Structural significance for technological application

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Starke, U.
Scientific Facility Interface Analysis (Ulrich Starke), Max Planck Institute for Solid State Research, Max Planck Society;

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Starke, U. (2003). Reconstruction and epitaxial adlayers on SiC surfaces: Structural significance for technological application. Materials Research Society Proceedings, 742, 35-46.

Cite as: https://hdl.handle.net/21.11116/0000-000E-E249-1

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