English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT

Released

Journal Article

Direct fabrication of parallel quantum dots with an atomic force microscope

MPS-Authors
/persons/resource/persons280029

Haug,  R. J.
Abteilung v. Klitzing, Former Departments, Max Planck Institute for Solid State Research, Max Planck Society;

/persons/resource/persons279906

Eberl,  K.
Former Scientific Facilities, Max Planck Institute for Solid State Research, Max Planck Society;

External Resource
No external resources are shared
Fulltext (restricted access)
There are currently no full texts shared for your IP range.
Fulltext (public)
There are no public fulltexts stored in PuRe
Supplementary Material (public)
There is no public supplementary material available
Citation

Keyser, U. F., Paesler, M., Zeitler, U., Haug, R. J., & Eberl, K. (2002). Direct fabrication of parallel quantum dots with an atomic force microscope. Physica E, 13(2-4), 1155-1158.


Cite as: https://hdl.handle.net/21.11116/0000-000E-E443-5
Abstract
We demonstrate the stepwise fabrication of parallel double
quantum dots in GaAs/AlGaAs-heterostructures. The atomic force
microscope serves as a direct lithographic tool for the
processing of our samples, The devices are characterized by
transport measurements. Coulomb-blockade oscillations and
diamonds with different periods for the two quantum dots are
observed. (C) 2002 Elsevier Science B.V, All rights reserved.