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Journal Article

Fluorescence spectroscopy and transmission electron microscopy of the same isolated semiconductor nanocrystals

MPS-Authors
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Philipp,  G.
Abteilung v. Klitzing, Former Departments, Max Planck Institute for Solid State Research, Max Planck Society;

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Burghard,  M.
Department Nanoscale Science (Klaus Kern), Max Planck Institute for Solid State Research, Max Planck Society;

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Citation

Koberling, F., Mews, A., Philipp, G., Kolb, U., Potapova, I., Burghard, M., et al. (2002). Fluorescence spectroscopy and transmission electron microscopy of the same isolated semiconductor nanocrystals. Applied Physics Letters, 81(6), 1116-1118.


Cite as: https://hdl.handle.net/21.11116/0000-000E-E3D1-5
Abstract
We present a method to establish a correlation between the
crystalline structure and the fluorescence properties of
isolated semiconductor nanocrystals. By using ultrathin silicon
nitride substrates with markers, we have localized and
investigated the same particles in both a high-resolution
transmission electron microscope (TEM) and a confocal optical
microscope. We have found that the observation of strong
fluorescence emission does not require single domain particles.
Additionally, we have correlated the size and shape of a
particle as determined by TEM and its spectral properties like
emission wavelength and spectral diffusion. (C) 2002 American
Institute of Physics.