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Journal Article

Charge confinement and uniformity of stacked InP quantum dots studied by magneto-optical spectroscopy

MPS-Authors
/persons/resource/persons280277

Manz,  Y. M.
Former Scientific Facilities, Max Planck Institute for Solid State Research, Max Planck Society;
Abteilung v. Klitzing, Former Departments, Max Planck Institute for Solid State Research, Max Planck Society;

/persons/resource/persons280485

Schmidt,  O. G.
Former Scientific Facilities, Max Planck Institute for Solid State Research, Max Planck Society;
Scientific Facility Nanostructuring Lab (Jürgen Weis), Max Planck Institute for Solid State Research, Max Planck Society;
Abteilung v. Klitzing, Former Departments, Max Planck Institute for Solid State Research, Max Planck Society;
Department Nanoscale Science (Klaus Kern), Max Planck Institute for Solid State Research, Max Planck Society;

/persons/resource/persons279906

Eberl,  K.
Former Scientific Facilities, Max Planck Institute for Solid State Research, Max Planck Society;

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Citation

Maes, J., Hayne, M., Manz, Y. M., Schmidt, O. G., Eberl, K., & Moshchalkov, V. V. (2002). Charge confinement and uniformity of stacked InP quantum dots studied by magneto-optical spectroscopy. Physica E, 13(2-4), 203-207.


Cite as: https://hdl.handle.net/21.11116/0000-000E-E9B3-1
Abstract
We have studied the magneto-photo luminescence (PL) of triply
stacked layers of self-assembled InP quantum dots, For a small
separation of the uppermost dot in (he triple stack from the
other two closely stacked layers, only one PL peak is observed,
whereas for a large separation two PL peaks are present: a
broad low-energy and a narrow high-energy peak. We propose a
model in which the low-energy peak is associated with the
uppermost dot where alignment faults result in enhanced size
fluctuations, broadening the line, The narrow high-energy peak
originates from charges located in the double stack. In the
large separation regime, an increased broadening of the PL
line-width indicates that the size fluctuations are augmented
as the layer separation is increased from 15 to 30 nm. (C) 2002
Elsevier Science B.V. All rights reserved.