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Journal Article

Electrical transport and AFM microscopy on V2O5-x-polyaniline nanorods

MPS-Authors
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Ferrer-Anglada,  N.
Abteilung v. Klitzing, Former Departments, Max Planck Institute for Solid State Research, Max Planck Society;

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Muster,  J.
Abteilung v. Klitzing, Former Departments, Max Planck Institute for Solid State Research, Max Planck Society;

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Burghard,  M.
Department Nanoscale Science (Klaus Kern), Max Planck Institute for Solid State Research, Max Planck Society;

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Roth,  S.
Abteilung v. Klitzing, Former Departments, Max Planck Institute for Solid State Research, Max Planck Society;

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Citation

Ferrer-Anglada, N., Gorri, J. A., Muster, J., Liu, K., Burghard, M., & Roth, S. (2001). Electrical transport and AFM microscopy on V2O5-x-polyaniline nanorods. Materials Science and Engineering C, 15, 237-239.


Cite as: https://hdl.handle.net/21.11116/0000-000E-E14D-E
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