Phonon Dispersion Curves in Wurtzite-Structure GaN Determined by Inelastic 
X-ray Scattering

Ruf, T.; Serrano, J.; Cardona, M.; Pavone, P.; Pabst, M.; Krisch, M.; D'Astuto, M.; Suski, T.; Grzegory, I.; Leszczynski, M.

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Phonon Dispersion Curves in Wurtzite-Structure GaN Determined by Inelastic X-ray Scattering

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Ruf, T.
Former Departments, Max Planck Institute for Solid State Research, Max Planck Society;

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Serrano, J.
Department Solid State Spectroscopy (Bernhard Keimer), Max Planck Institute for Solid State Research, Max Planck Society;

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Cardona, M.
Former Departments, Max Planck Institute for Solid State Research, Max Planck Society;

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Ruf, T., Serrano, J., Cardona, M., Pavone, P., Pabst, M., Krisch, M., et al. (2001). Phonon Dispersion Curves in Wurtzite-Structure GaN Determined by Inelastic X-ray Scattering. Physical Review Letters, 86, 906-909.

Cite as: https://hdl.handle.net/21.11116/0000-000E-EC2D-7

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