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A low-temperature scanning force microscope for investigating buried two-dimensional electron systems under quantum Hall conditions

MPS-Authors
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Weitz,  P.
Abteilung v. Klitzing, Former Departments, Max Planck Institute for Solid State Research, Max Planck Society;

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Ahlswede,  E.
Scientific Facility Nanostructuring Lab (Jürgen Weis), Max Planck Institute for Solid State Research, Max Planck Society;
Abteilung v. Klitzing, Former Departments, Max Planck Institute for Solid State Research, Max Planck Society;

/persons/resource/persons280650

Weis,  J.
Scientific Facility Nanostructuring Lab (Jürgen Weis), Max Planck Institute for Solid State Research, Max Planck Society;
Abteilung v. Klitzing, Former Departments, Max Planck Institute for Solid State Research, Max Planck Society;

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von Klitzing,  K.
Abteilung v. Klitzing, Former Departments, Max Planck Institute for Solid State Research, Max Planck Society;

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Eberl,  K.
Former Scientific Facilities, Max Planck Institute for Solid State Research, Max Planck Society;

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Citation

Weitz, P., Ahlswede, E., Weis, J., von Klitzing, K., & Eberl, K. (2000). A low-temperature scanning force microscope for investigating buried two-dimensional electron systems under quantum Hall conditions. Applied Surface Science, 157, 349-354.


Cite as: https://hdl.handle.net/21.11116/0000-000E-E831-5
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