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Dielectric function of hexagonal AlN films determined by spectroscopic elipsometry in the vacuum-uv spectral range.

MPS-Authors
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Wethkamp,  T.
Former Departments, Max Planck Institute for Solid State Research, Max Planck Society;

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Esser,  N.
Former Departments, Max Planck Institute for Solid State Research, Max Planck Society;

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Cardona,  M.
Former Departments, Max Planck Institute for Solid State Research, Max Planck Society;

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Wethkamp, T., Wilmers, K., Cobet, C., Esser, N., Richter, W., Ambacher, O., et al. (1999). Dielectric function of hexagonal AlN films determined by spectroscopic elipsometry in the vacuum-uv spectral range. Physical Review B, 59, 1845-1849.


Cite as: https://hdl.handle.net/21.11116/0000-000E-D652-4
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