Far infrared ellipsometry using synchrotron radiation: the out-of-plane 
response of La2- xSrxCuO4.

Henn, R. W.; Bernhard, C.; Wittlin, A.; Cardona, M.; Uchida, S.

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Far infrared ellipsometry using synchrotron radiation: the out-of-plane response of La_{2- x}Sr_xCuO₄.

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Henn, R. W.
Former Scientific Facilities, Max Planck Institute for Solid State Research, Max Planck Society;

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Bernhard, C.
Department Solid State Spectroscopy (Bernhard Keimer), Max Planck Institute for Solid State Research, Max Planck Society;

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Cardona, M.
Former Departments, Max Planck Institute for Solid State Research, Max Planck Society;

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Henn, R. W., Bernhard, C., Wittlin, A., Cardona, M., & Uchida, S. (1998). Far infrared ellipsometry using synchrotron radiation: the out-of-plane response of La_{2- x}Sr_xCuO₄. Thin Solid Films, 313-314, 642-648.

Cite as: https://hdl.handle.net/21.11116/0000-000E-D64A-E

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