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Optical characterization of Ru2Si3 by spectroscopic ellipsometry, UV-VIS-NIR spectroscopy and band structure calculations.

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Antonov,  V. N.
Former Departments, Max Planck Institute for Solid State Research, Max Planck Society;

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Jepsen,  O.
Former Departments, Max Planck Institute for Solid State Research, Max Planck Society;

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Henrion, W., Rebien, M., Antonov, V. N., Jepsen, O., & Lange, H. (1998). Optical characterization of Ru2Si3 by spectroscopic ellipsometry, UV-VIS-NIR spectroscopy and band structure calculations. Thin Solid Films, 313-314, 218-221.


Cite as: https://hdl.handle.net/21.11116/0000-000E-DCA8-D
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