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Journal Article

Spectroscopic ellipsometry of AlxGa1-xN in the energy range 3-25 eV.

MPS-Authors
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Wethkamp,  T.
Former Departments, Max Planck Institute for Solid State Research, Max Planck Society;

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Esser,  N.
Former Departments, Max Planck Institute for Solid State Research, Max Planck Society;

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Cardona,  M.
Former Departments, Max Planck Institute for Solid State Research, Max Planck Society;

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Wethkamp, T., Wilmers, K., Esser, N., Richter, W., Ambacher, O., Angerer, H., et al. (1998). Spectroscopic ellipsometry of AlxGa1-xN in the energy range 3-25 eV. Thin Solid Films, 313-314, 745-750.


Cite as: https://hdl.handle.net/21.11116/0000-000E-D5BA-0
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