Optical and structural characterization of silicon microstructures fabricated 
by laser interference crystallization.

Wagner, S.; Toet, D.; Aichmayr, G.; Mulato, M.; Santos, P. V.; Spangenberg, A.; Bergmann, R.

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Optical and structural characterization of silicon microstructures fabricated by laser interference crystallization.

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Santos, P. V.
Former Departments, Max Planck Institute for Solid State Research, Max Planck Society;

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Spangenberg, A.
Department Physical Chemistry of Solids (Joachim Maier), Max Planck Institute for Solid State Research, Max Planck Society;

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Toet, D., Aichmayr, G., Mulato, M., Santos, P. V., Spangenberg, A., & Bergmann, R. (1997). Optical and structural characterization of silicon microstructures fabricated by laser interference crystallization. In Amorphous and Microcrystalline Silicon Technology - 1997 (pp. 337-342). Pittsburgh: Materials Research Society.

Cite as: https://hdl.handle.net/21.11116/0000-000E-D8B0-7

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