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Coulomb-correlated few-electron states in a transmission electron microscope beam

MPS-Authors

Haindl,  Rudolf
Department of Ultrafast Dynamics, Max Planck Institute for Multidisciplinary Sciences, Max Planck Society;

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Feist,  Armin
Department of Ultrafast Dynamics, Max Planck Institute for Multidisciplinary Sciences, Max Planck Society;

Domröse,  Till
Department of Ultrafast Dynamics, Max Planck Institute for Multidisciplinary Sciences, Max Planck Society;

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Möller,  Marcel
Department of Ultrafast Dynamics, Max Planck Institute for Multidisciplinary Sciences, Max Planck Society;

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Yalunin,  Sergey V.
Department of Ultrafast Dynamics, Max Planck Institute for Multidisciplinary Sciences, Max Planck Society;

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Ropers,  Claus       
Department of Ultrafast Dynamics, Max Planck Institute for Multidisciplinary Sciences, Max Planck Society;

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2209.12300.pdf
(Preprint), 4MB

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Citation

Haindl, R., Feist, A., Domröse, T., Möller, M., Yalunin, S. V., & Ropers, C. (2022). Coulomb-correlated few-electron states in a transmission electron microscope beam. arXiv. doi:10.48550/arXiv.2209.12300.


Cite as: https://hdl.handle.net/21.11116/0000-000B-53F1-7
Abstract
We observe Coulomb-correlated electron pair and triple states generated by femtosecond photoemission from a nanoscale field emitter inside a transmission electron microscope. Event-based electron spectroscopy allows for spatial and spectral characterization of the electrons emitted by each laser pulse. Distinctive energy and momentum correlations of two- and three-electron states are identified, revealing a strong few-body Coulomb interaction at an energy scale of about two electronvolts. State-sorted beam caustics show a discrete increase in virtual source size and longitudinal source shift for few-electron states, associated with transverse momentum correlations. The pronounced spatial and spectral characteristics of these electron number states allow for filtering schemes that control the statistical distribution of the pulse charge. In this way, the fraction of specific few-electron states can be actively suppressed or enhanced, facilitating the preparation of highly non-Poissonian electron beams for microscopy and lithography, including future schemes in correlated two-electron probing.