In-situ sputtering from the micromanipulator to enable cryogenic preparation of 
specimens for atom probe tomography by focused-ion beam

Douglas, James O.; Conroy, Michele A.; Giuliani, Finn; Gault, Baptiste

doi:10.48550/arXiv.2211.06877

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In-situ sputtering from the micromanipulator to enable cryogenic preparation of specimens for atom probe tomography by focused-ion beam

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Gault, Baptiste
Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;
Imperial College, Royal School of Mines, Department of Materials, London, SW7 2AZ, UK;

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Douglas, J. O., Conroy, M. A., Giuliani, F., & Gault, B. (2022). In-situ sputtering from the micromanipulator to enable cryogenic preparation of specimens for atom probe tomography by focused-ion beam. arXiv. doi:10.48550/arXiv.2211.06877.

Cite as: https://hdl.handle.net/21.11116/0000-0010-0305-5

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