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Conference Paper

Focusing Through Scattering Materials Using Deep Neural Networks

MPS-Authors
/persons/resource/persons250112

Vishniakou,  Ivan
Max Planck Research Group Neural Circuits, Center of Advanced European Studies and Research (caesar), Max Planck Society;

/persons/resource/persons188171

Seelig,  Johannes D.       
Max Planck Research Group Neural Circuits, Center of Advanced European Studies and Research (caesar), Max Planck Society;

External Resource

https://opg.optica.org/abstract.cfm?uri=aoms-2020-OTh4B.3
(Abstract)

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Citation

Vishniakou, I., & Seelig, J. D. (2020). Focusing Through Scattering Materials Using Deep Neural Networks. In Imaging and Applied Optics Congress, OSA Technical Digest. Optica Publishing Group.


Cite as: https://hdl.handle.net/21.11116/0000-000B-F5A4-7
Abstract
Neural networks offer novel approaches for light control in microscopy. We compare different deep neural network architectures for focusing through scattering materials for applications in biological imaging.