Large Loss Matters in Weakly Supervised Multi-Label Classification

Kim, Youngwook; Kim, Jae Myung; Akata, Zeynep; Lee, Jungwoo

doi:10.1109/CVPR52688.2022.01376

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Large Loss Matters in Weakly Supervised Multi-Label Classification

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Akata, Zeynep
Computer Vision and Machine Learning, MPI for Informatics, Max Planck Society;

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Kim, Y., Kim, J. M., Akata, Z., & Lee, J. (2022). Large Loss Matters in Weakly Supervised Multi-Label Classification. In IEEE/CVF Conference on Computer Vision and Pattern Recognition (pp. 14136-14145). Piscataway, NJ: IEEE. doi:10.1109/CVPR52688.2022.01376.

Cite as: https://hdl.handle.net/21.11116/0000-000C-13A7-2

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