Label-Descriptive Patterns and Their Application to Characterizing 
Classification Errors

Hedderich, Michael A.; Fischer, Jonas; Klakow, Dietrich; Vreeken, Jilles

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Label-Descriptive Patterns and Their Application to Characterizing Classification Errors

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Fischer, Jonas
Databases and Information Systems, MPI for Informatics, Max Planck Society;

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Hedderich, M. A., Fischer, J., Klakow, D., & Vreeken, J. (2022). Label-Descriptive Patterns and Their Application to Characterizing Classification Errors. In K. Chaudhuri, S. Jegelka, S. Le, S. Csaba, N. Gang, & S. Sabato (Eds.), Proceedings of the 39th International Conference on Machine Learning (pp. 8691-8707). Retrieved from https://proceedings.mlr.press/v162/hedderich22a.html.

Cite as: https://hdl.handle.net/21.11116/0000-000C-165A-7

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