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Atomistic structures of〈0001〉tilt grain boundaries in a textured Mg thin film

MPS-Authors
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Zhang,  Siyuan
Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Ahmad,  Saba
Advanced Transmission Electron Microscopy, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Abdellaoui,  Lamya
Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Zhou,  Xuyang
Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Cautaerts,  Niels
Advanced Transmission Electron Microscopy, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Breitbach,  Benjamin
Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Scheu,  Christina
Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;
Materials Chemistry, Lehrstuhl für Werkstoffchemie, RWTH Aachen, Germany;

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Citation

Zhang, S., Xie, Z., Keuter, P., Ahmad, S., Abdellaoui, L., Zhou, X., et al. (2022). Atomistic structures of〈0001〉tilt grain boundaries in a textured Mg thin film. Nanoscale, 14(48), 18192-18199. doi:10.1039/D2NR05505H.


Cite as: https://hdl.handle.net/21.11116/0000-000C-386B-E
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