Simulated Adversarial Testing of Face Recognition Models

Ruiz, Nataniel; Kortylewski, Adam; Qiu, Weichao; Xie, Cihang; Bargal, Sarah Adel; Yuille, Alan; Sclaroff, Stan

doi:10.1109/CVPR52688.2022.00411

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Simulated Adversarial Testing of Face Recognition Models

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Kortylewski, Adam
Visual Computing and Artificial Intelligence, MPI for Informatics, Max Planck Society;

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Ruiz, N., Kortylewski, A., Qiu, W., Xie, C., Bargal, S. A., Yuille, A., et al. (2022). Simulated Adversarial Testing of Face Recognition Models. In IEEE/CVF Conference on Computer Vision and Pattern Recognition (pp. 4135-4145). Piscataway, NJ: IEEE. doi:10.1109/CVPR52688.2022.00411.

Cite as: https://hdl.handle.net/21.11116/0000-000C-70C7-5

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