Bias and synergy in the self-consistent approach of data analysis of ion beam 
techniques

Silva, T. F.; Rodrigues, C. L.; Tabacniks, M. H.; Toussaint, U. von; Mayer, M.

doi:10.1016/j.nimb.2022.10.008

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Bias and synergy in the self-consistent approach of data analysis of ion beam techniques

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Toussaint, U. von
Numerical Methods in Plasma Physics (NMPP), Max Planck Institute for Plasma Physics, Max Planck Society;

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Mayer, M.
Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society;

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Silva, T. F., Rodrigues, C. L., Tabacniks, M. H., Toussaint, U. v., & Mayer, M. (2022). Bias and synergy in the self-consistent approach of data analysis of ion beam techniques. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 533, 9-16. doi:10.1016/j.nimb.2022.10.008.

Cite as: https://hdl.handle.net/21.11116/0000-000C-9C04-0

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