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Conference Paper

RR: A Fault Model for Efficient TEE Replication

MPS-Authors
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Dinis,  Baltasar
Group P. Druschel, Max Planck Institute for Software Systems, Max Planck Society;

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Druschel,  Peter
Group P. Druschel, Max Planck Institute for Software Systems, Max Planck Society;

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ndss2023_f1_paper.pdf
(Publisher version), 545KB

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Citation

Dinis, B., Druschel, P., & Rodrigues, R. (2023). RR: A Fault Model for Efficient TEE Replication. In Network and Distributed System Security Symposium. Reston, VA: Internet Society. doi:10.14722/ndss.2023.2400.


Cite as: https://hdl.handle.net/21.11116/0000-000D-0D77-0
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