Ion energy dependence of the D supersaturated surface layer thickness in W due 
to D plasma exposure at incident energies between 75-175 eV

Nishijima, D.; Tokitani, M.; Masuzaki, S.; Nagata, D.; Schwarz-Selinger, T.; Zaloznik, A.; Zhao, M.; Baldwin, M. J.; Doerner, R. P.; Patino, M. I.; Simmonds, M. J.; Tynan, G. R.

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Ion energy dependence of the D supersaturated surface layer thickness in W due to D plasma exposure at incident energies between 75-175 eV

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Schwarz-Selinger, T.
Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society;

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Nishijima, D., Tokitani, M., Masuzaki, S., Nagata, D., Schwarz-Selinger, T., Zaloznik, A., et al. (2023). Ion energy dependence of the D supersaturated surface layer thickness in W due to D plasma exposure at incident energies between 75-175 eV. Talk presented at 19th International Conference on Plasma-Facing Materials and Components for Fusion Applications (PFMC-19). Bonn. 2023-05-22 - 2023-05-26.

Cite as: https://hdl.handle.net/21.11116/0000-000D-342A-A

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