A fully synthetic type-I ELM cycle diagnostic using conventional O-mode 
reflectometry

Vicente, J.; Cathey, A.; Silva, F. da; Heuraux, S.; Hoelzl, M.; Conway, G. D.

doi:10.1063/5.0162612

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A fully synthetic type-I ELM cycle diagnostic using conventional O-mode reflectometry

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Cathey, A.
Office of the Director (DI), Max Planck Institute for Plasma Physics, Max Planck Society;

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Hoelzl, M.
Office of the Director (DI), Max Planck Institute for Plasma Physics, Max Planck Society;

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Conway, G. D.
Physics of the Plasma Edge (E2), Max Planck Institute for Plasma Physics, Max Planck Society;

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https://doi.org/10.1063/5.0162612
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Citation

Vicente, J., Cathey, A., Silva, F. d., Heuraux, S., Hoelzl, M., & Conway, G. D. (2023). A fully synthetic type-I ELM cycle diagnostic using conventional O-mode reflectometry. AIP Conference Proceedings, 2984(1): 110005. doi:10.1063/5.0162612.

Cite as: https://hdl.handle.net/21.11116/0000-000D-CEFC-0

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