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Inline electron holography and VEELS for the measurement of strain in ternary and quaternary (In,Al,Ga)N alloyed thin films and its effect on bandgap energy

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Sigle,  W.
Scientific Facility Stuttgart Center for Electron Microscopy (Peter A. van Aken), Max Planck Institute for Solid State Research, Max Planck Society;

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van Aken,  P. A.
Scientific Facility Stuttgart Center for Electron Microscopy (Peter A. van Aken), Max Planck Institute for Solid State Research, Max Planck Society;

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Mánuel, J. M., Koch, C. T., Özdöl, V. B., Sigle, W., van Aken, P. A., García, R., et al. (2015). Inline electron holography and VEELS for the measurement of strain in ternary and quaternary (In,Al,Ga)N alloyed thin films and its effect on bandgap energy. Journal of Microscopy, 261, 27-35.


Cite as: https://hdl.handle.net/21.11116/0000-000E-CB50-3
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