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Bias-stress stability of low-voltage p-channel and n-channel organic thin-film transistors on flexible plastic substrates

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Zschieschang,  U.
Research Group Organic Electronics (Hagen Klauk), Max Planck Institute for Solid State Research, Max Planck Society;

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Klauk,  H.
Research Group Organic Electronics (Hagen Klauk), Max Planck Institute for Solid State Research, Max Planck Society;

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Bisoyi, S., Zschieschang, U., Kang, M. J., Takimiya, K., Klauk, H., & Tiwari, S. P. (2014). Bias-stress stability of low-voltage p-channel and n-channel organic thin-film transistors on flexible plastic substrates. Organic Electronics, 15(11), 3173-3182.


Cite as: https://hdl.handle.net/21.11116/0000-000E-CA08-6
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