Tracing the localization of 4f electrons: Angle-resolved photoemission on YbCo2
Si2, the stable trivalent counterpart of the heavy-fermion YbRh2Si2

Güttler, M.; Kummer, K.; Patil, S.; Höppner, M.; Hannaske, A.; Danzenbaecher, S.; Shi, M.; Radovic, M.; Rienks, E.; Laubschat, C.; Geibel, C.; Vyalikh, D. V.

Item

ITEM ACTIONSEXPORT

Add to Basket

Local TagsRelease HistoryDetailsSummary

Released

Journal Article

Tracing the localization of 4f electrons: Angle-resolved photoemission on YbCo₂Si₂, the stable trivalent counterpart of the heavy-fermion YbRh₂Si₂

MPS-Authors

Höppner, M.
Max Planck Society;

External Resource

No external resources are shared

Fulltext (restricted access)

There are currently no full texts shared for your IP range.

Fulltext (public)

There are no public fulltexts stored in PuRe

Supplementary Material (public)

There is no public supplementary material available

Citation

Güttler, M., Kummer, K., Patil, S., Höppner, M., Hannaske, A., Danzenbaecher, S., et al. (2014). Tracing the localization of 4f electrons: Angle-resolved photoemission on YbCo₂Si₂, the stable trivalent counterpart of the heavy-fermion YbRh₂Si₂. Physical Review B, 90(19): 195138.

Cite as: https://hdl.handle.net/21.11116/0000-000E-C894-9

Abstract

There is no abstract available