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Journal Article

Controlling Exchange Coupling Strength in NixCu1-x Thin Films

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Keller,  T.
Department Solid State Spectroscopy (Bernhard Keimer), Max Planck Institute for Solid State Research, Max Planck Society;

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Citation

Nagy, B., Khaydukov, Y. N., Kiss, L. F., Sajti, S., Merkel, D. G., Tancziko, F., et al. (2013). Controlling Exchange Coupling Strength in NixCu1-x Thin Films. Journal of Superconductivity and Novel Magnetism, 26, 1957-1961.


Cite as: https://hdl.handle.net/21.11116/0000-000E-C5D5-3
Abstract
The thickness (d(F)) and concentration (x) dependence of the Curie temperature of NixCu1-x (d(F)) ferromagnetic alloy layers (x = 0.55, 0.65, d(F) = [4.5 nm divided by 12 nm]) in contact with a vanadium layer was studied. The Curie temperature of the ferromagnetic layers depends on the thickness when it is comparable with the transition layer between the F and the vanadium layers, which is attributed to the proximity coupling of the interface region with the rest of the F layer. The present study provides valuable information for fabrication of samples with controlled exchange coupling strength for studies of superconductor/ferromagnet proximity effects.