English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT

Released

Journal Article

Ultrafast transverse thermoelectric response in c-axis inclined epitaxial La0.5Sr0.5CoO3 thin films

MPS-Authors
/persons/resource/persons280695

Yu,  L.
Scientific Facility Thin Film Technology (Gennady Logvenov), Max Planck Institute for Solid State Research, Max Planck Society;
Department Solid State Spectroscopy (Bernhard Keimer), Max Planck Institute for Solid State Research, Max Planck Society;

/persons/resource/persons280640

Wang,  Y.
Department Nanoscale Science (Klaus Kern), Max Planck Institute for Solid State Research, Max Planck Society;

/persons/resource/persons280716

Zhang,  P. X.
Scientific Facility Crystal Growth (Masahiko Isobe), Max Planck Institute for Solid State Research, Max Planck Society;
Scientific Facility Thin Film Technology (Gennady Logvenov), Max Planck Institute for Solid State Research, Max Planck Society;

/persons/resource/persons280017

Habermeier,  H.-U.
Department Solid State Spectroscopy (Bernhard Keimer), Max Planck Institute for Solid State Research, Max Planck Society;
Scientific Facility Thin Film Technology (Gennady Logvenov), Max Planck Institute for Solid State Research, Max Planck Society;
Department Physical Chemistry of Solids (Joachim Maier), Max Planck Institute for Solid State Research, Max Planck Society;

External Resource
No external resources are shared
Fulltext (restricted access)
There are currently no full texts shared for your IP range.
Fulltext (public)
There are no public fulltexts stored in PuRe
Supplementary Material (public)
There is no public supplementary material available
Citation

Yu, L., Wang, Y., Zhang, P. X., & Habermeier, H.-U. (2013). Ultrafast transverse thermoelectric response in c-axis inclined epitaxial La0.5Sr0.5CoO3 thin films. physica status solidi (RRL), 7(3), 180-183.


Cite as: https://hdl.handle.net/21.11116/0000-000E-C415-D
Abstract
Ultrafast transverse thermoelectric voltage response has been observed in c-axis inclined epitaxial La0.5Sr0.5CoO3 thin films. Voltage signals with the rise time of 7 ns have been detected under the irradiation of pulse laser with duration of 28 ns. A concept, named response rate ratio, has been proposed to evaluate the intrinsic response rate, and this ratio in La0.5Sr0.5CoO3 is smaller than that in other reported materials. The low resistivity is thought to be responsible for the ultrafast response, as low resistivity induces small optical penetration depth, and response time has a monotonous increasing relationship with this depth. [GRAPHICS] . Transverse thermoelectric voltage with the rise time of 7 ns in La0.5Sr0.5CoO3 thin film. (C) 2013 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim