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Magnetic domain pattern asymmetry in (Ga, Mn)As/(Ga, In)As with in-plane anisotropy

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Honolka,  J.
Department Nanoscale Science (Klaus Kern), Max Planck Institute for Solid State Research, Max Planck Society;

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Kern,  K.
Department Nanoscale Science (Klaus Kern), Max Planck Institute for Solid State Research, Max Planck Society;

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Citation

Herrera Diez, L., Rapp, C., Schoch, W., Limmer, W., Gourdon, C., Jeudy, V., et al. (2012). Magnetic domain pattern asymmetry in (Ga, Mn)As/(Ga, In)As with in-plane anisotropy. Journal of Applied Physics, 111(8): 083908.


Cite as: https://hdl.handle.net/21.11116/0000-000E-C21A-A
Abstract
Appropriate adjustment of the tensile strain in (Ga, Mn)As/(Ga,In)As films allows for the coexistence of in-plane magnetic anisotropy, typical of compressively strained (Ga, Mn)As/GaAs films, and the so-called cross-hatch dislocation pattern seeded at the (Ga, In) As/GaAs interface. Kerr microscopy reveals a close correlation between the in-plane magnetic domain and dislocation patterns, absent in compressively strained materials. Moreover, the magnetic domain pattern presents a strong asymmetry in the size and number of domains for applied fields along the easy [1 (1) over bar0] and hard [110] directions which is attributed to different domain wall nucleation/propagation energies. This strong influence of the dislocation lines in the domain wall propagation/nucleation provides a lithography-free route to the effective trapping of domain walls in magneto-transport devices based on (Ga, Mn) As with in-plane anisotropy. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4704385]