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Journal Article

Effect of PbZr0.52Ti0.48O3 thin layer on structure, electronic and magnetic properties of La0.65Sr0.35MnO3 and La0.65Ca0.30MnO3 thin-films

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Razavi,  F. S.
Scientific Facility Thin Film Technology (Gennady Logvenov), Max Planck Institute for Solid State Research, Max Planck Society;
Former Scientific Facilities, Max Planck Institute for Solid State Research, Max Planck Society;

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Kremer,  R. K.
Former Scientific Facilities, Max Planck Institute for Solid State Research, Max Planck Society;

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Habermeier,  H.-U.
Department Solid State Spectroscopy (Bernhard Keimer), Max Planck Institute for Solid State Research, Max Planck Society;
Scientific Facility Thin Film Technology (Gennady Logvenov), Max Planck Institute for Solid State Research, Max Planck Society;
Department Physical Chemistry of Solids (Joachim Maier), Max Planck Institute for Solid State Research, Max Planck Society;

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Citation

Hezareh, T., Razavi, F. S., Kremer, R. K., Habermeier, H.-U., Lebedev, O. I., Kirilenko, D., et al. (2011). Effect of PbZr0.52Ti0.48O3 thin layer on structure, electronic and magnetic properties of La0.65Sr0.35MnO3 and La0.65Ca0.30MnO3 thin-films. Journal of Applied Physics, 109(11): 113707.


Cite as: https://hdl.handle.net/21.11116/0000-000E-C139-8
Abstract
Epitaxial thin film heterostructures of high dielectric PbZr(1-x)Ti(x)O(3) (PZT) and La(1-x)A(x)MnO(3) (A-divalent alkaline earth metals such as Sr (LSMO) and Ca (LCMO)) were grown on SrTiO(3) substrates and their structure, temperature dependence of electrical resistivity, and magnetization were investigated as a function of the thickness of the LSMO(LCMO) layer. The microstructures of the samples were analyzed by TEM. By applying an electric field across the PZT layer, we applied a ferrodistortive pressure on the manganite layer and studied the correlations between lattice distortion and electric transport and magnetic properties of the CMR materials. (C) 2011 American Institute of Physics. [doi: 10.1063/1.3592660]