In situ transmission electron microscopy imaging of grain growth in a platinum 
nanobridge induced by electric current annealing

Gao, B.; Rudneva, M.; McGarrity, K. S.; Xu, Q.; Prins, F.; Thijssen, J. M.; Zandbergen, H.; van der Zant, H. S. J.

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In situ transmission electron microscopy imaging of grain growth in a platinum nanobridge induced by electric current annealing

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Gao, B.
Max Planck Society;

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Citation

Gao, B., Rudneva, M., McGarrity, K. S., Xu, Q., Prins, F., Thijssen, J. M., et al. (2011). In situ transmission electron microscopy imaging of grain growth in a platinum nanobridge induced by electric current annealing. Nanotechnology, 22(20): 205705.

Cite as: https://hdl.handle.net/21.11116/0000-000E-C0AD-6

Abstract

We report an in situ transmission electron microscopy (TEM) imaging of grain growth in a Pt nanobridge induced by a high electric current density. The change in morphology at the nanoscale was recorded in real time together with the electrical characterization of the Pt nanobridge. We find a drop in the differential resistance as the voltage across the bridge is increased; TEM inspection shows that this coincides with thermally induced grain growth, indicating that a reduction of grain boundary scattering is the cause of the resistance decrease.