Parametric Rietveld refinement for the evaluation of powder diffraction 
patterns collected as a function of pressure

Halasz, I.; Dinnebier, R. E.; Angel, R.

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Parametric Rietveld refinement for the evaluation of powder diffraction patterns collected as a function of pressure

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Dinnebier, R. E.
Scientific Facility X-Ray Diffraction (Robert E. Dinnebier), Max Planck Institute for Solid State Research, Max Planck Society;

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Halasz, I., Dinnebier, R. E., & Angel, R. (2010). Parametric Rietveld refinement for the evaluation of powder diffraction patterns collected as a function of pressure. Journal of Applied Crystallography, 43, 504-510.

Cite as: https://hdl.handle.net/21.11116/0000-000E-BBFA-6

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