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Highly Reliable Carbon Nanotube Transistors with Patterned Gates and Molecular Gate Dielectric

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Weitz,  R. T.
Scientific Facility Nanostructuring Lab (Jürgen Weis), Max Planck Institute for Solid State Research, Max Planck Society;
Abteilung v. Klitzing, Former Departments, Max Planck Institute for Solid State Research, Max Planck Society;
Research Group Solid State Nanophysics (Jurgen H. Smet), Max Planck Institute for Solid State Research, Max Planck Society;
Department Nanoscale Science (Klaus Kern), Max Planck Institute for Solid State Research, Max Planck Society;

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Zschieschang,  U.
Research Group Organic Electronics (Hagen Klauk), Max Planck Institute for Solid State Research, Max Planck Society;

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Forment-Aliaga,  A.
Department Nanoscale Science (Klaus Kern), Max Planck Institute for Solid State Research, Max Planck Society;

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Burghard,  M.
Department Nanoscale Science (Klaus Kern), Max Planck Institute for Solid State Research, Max Planck Society;

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Kern,  K.
Department Nanoscale Science (Klaus Kern), Max Planck Institute for Solid State Research, Max Planck Society;

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Klauk,  H.
Research Group Organic Electronics (Hagen Klauk), Max Planck Institute for Solid State Research, Max Planck Society;

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Citation

Weitz, R. T., Zschieschang, U., Forment-Aliaga, A., Kälblein, D., Burghard, M., Kern, K., et al. (2009). Highly Reliable Carbon Nanotube Transistors with Patterned Gates and Molecular Gate Dielectric. Nano Letters, 9(4), 1335-1340.


Cite as: https://hdl.handle.net/21.11116/0000-000E-BAA5-6
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