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Journal Article

Substrate-induced anisotropy of c-axis textured NaxCoO2 thin films

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Yu,  L.
Scientific Facility Thin Film Technology (Gennady Logvenov), Max Planck Institute for Solid State Research, Max Planck Society;
Department Solid State Spectroscopy (Bernhard Keimer), Max Planck Institute for Solid State Research, Max Planck Society;

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Krockenberger,  Y.
Scientific Facility Thin Film Technology (Gennady Logvenov), Max Planck Institute for Solid State Research, Max Planck Society;
Department Solid State Spectroscopy (Bernhard Keimer), Max Planck Institute for Solid State Research, Max Planck Society;

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Fritsch,  I.
Scientific Facility Thin Film Technology (Gennady Logvenov), Max Planck Institute for Solid State Research, Max Planck Society;

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Habermeier,  H.-U.
Department Solid State Spectroscopy (Bernhard Keimer), Max Planck Institute for Solid State Research, Max Planck Society;
Scientific Facility Thin Film Technology (Gennady Logvenov), Max Planck Institute for Solid State Research, Max Planck Society;
Department Physical Chemistry of Solids (Joachim Maier), Max Planck Institute for Solid State Research, Max Planck Society;

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Citation

Yu, L., Krockenberger, Y., Fritsch, I., & Habermeier, H.-U. (2007). Substrate-induced anisotropy of c-axis textured NaxCoO2 thin films. Progress in Solid State Chemistry, 35(2-4 Sp. Iss.), 545-551.


Cite as: https://hdl.handle.net/21.11116/0000-000E-B4F0-7
Abstract
NaxCoO2 [x = 0.51, 0.54, and 0.59] thin films have been grown on SrTiO3 (100)-oriented single crystals with a 5 degrees vicinal cut towards [010] by pulsed laser deposition. We analysed the films by X-ray diffractometry, atomic force microscopy (AFM), and dc-transport measurements. X-ray diffraction patterns of the films show single phase and c-axis textured growth with the film plane closely aligned to the [001]-direction of 5 degrees miscut SrTiO3 (001) substrates. In addition to the structural analysis of these films we performed transport measurements along and perpendicular to the substrate tilt direction and determined the resistivity anisotropy as a function of temperature. The results enable the development of a strategy for the fabrication of NaxCoO2 based thermoelectric thin film devices. (c) 2007 Elsevier Ltd. All rights reserved.