English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT

Released

Journal Article

Effects of compressive stress on the critical current of Bi-2223 tapes

MPS-Authors
/persons/resource/persons280318

Mossang,  E.
High Magnetic Field Laboratory, Former Departments, Max Planck Institute for Solid State Research, Max Planck Society;

/persons/resource/persons280716

Zhang,  P. X.
Scientific Facility Crystal Growth (Masahiko Isobe), Max Planck Institute for Solid State Research, Max Planck Society;
Scientific Facility Thin Film Technology (Gennady Logvenov), Max Planck Institute for Solid State Research, Max Planck Society;

External Resource
No external resources are shared
Fulltext (restricted access)
There are currently no full texts shared for your IP range.
Fulltext (public)
There are no public fulltexts stored in PuRe
Supplementary Material (public)
There is no public supplementary material available
Citation

Li, C. S., Mossang, E., Bellin, B., Antonevici, A., & Zhang, P. X. (2007). Effects of compressive stress on the critical current of Bi-2223 tapes. Physica C, 463, 882-884.


Cite as: https://hdl.handle.net/21.11116/0000-000E-B44D-1
Abstract
We measured the critical current of Bi-2223 tapes as a function of transverse compressive stress perpendicular to the tape surface and side compressive stress parallel to the tape surface at 77 K. The effects of the cross-section size on the stress characteristics of AgMn-alloy sheathed Bi-2223 tapes were compared. The onset compressive stress for degradation of I, was lower in the thinner tape with a thin Ag sheath due to the stress concentration on the irregular interface. The irreversible transverse compressive stress and side compressive stress of the tapes with AgMn-alloy sheath were usually higher than 100 M Pa, which essentially meet the requirements of technical application. (C) 2007 Elsevier B.V. All rights reserved.