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Journal Article

Controlled fabrication of Cr/Si and Cr/SiGe tubes tethered to insulator substrates

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Cavallo,  F.
Former Scientific Facilities, Max Planck Institute for Solid State Research, Max Planck Society;

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Sigle,  W.
Scientific Facility Stuttgart Center for Electron Microscopy (Peter A. van Aken), Max Planck Institute for Solid State Research, Max Planck Society;

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Schmidt,  O. G.
Former Scientific Facilities, Max Planck Institute for Solid State Research, Max Planck Society;
Scientific Facility Nanostructuring Lab (Jürgen Weis), Max Planck Institute for Solid State Research, Max Planck Society;
Abteilung v. Klitzing, Former Departments, Max Planck Institute for Solid State Research, Max Planck Society;
Department Nanoscale Science (Klaus Kern), Max Planck Institute for Solid State Research, Max Planck Society;

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Citation

Cavallo, F., Sigle, W., & Schmidt, O. G. (2008). Controlled fabrication of Cr/Si and Cr/SiGe tubes tethered to insulator substrates. Journal of Applied Physics, 103(11): 116103.


Cite as: https://hdl.handle.net/21.11116/0000-000E-AF17-4
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