Correlation of structural and magnetic properties of ferromagnetic Mn-implanted 
Si1-xGex films

Ko, V.; Teo, K. L.; Liew, T.; Chong, T. C.; Liu, T.; Wee, A. T. S.; Du, A. Y.; Stoffel, M.; Schmidt, O. G.

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Correlation of structural and magnetic properties of ferromagnetic Mn-implanted Si_1-xGe_x films

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Stoffel, M.
Department Nanoscale Science (Klaus Kern), Max Planck Institute for Solid State Research, Max Planck Society;

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Schmidt, O. G.
Former Scientific Facilities, Max Planck Institute for Solid State Research, Max Planck Society;
Scientific Facility Nanostructuring Lab (Jürgen Weis), Max Planck Institute for Solid State Research, Max Planck Society;
Abteilung v. Klitzing, Former Departments, Max Planck Institute for Solid State Research, Max Planck Society;
Department Nanoscale Science (Klaus Kern), Max Planck Institute for Solid State Research, Max Planck Society;

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Ko, V., Teo, K. L., Liew, T., Chong, T. C., Liu, T., Wee, A. T. S., et al. (2008). Correlation of structural and magnetic properties of ferromagnetic Mn-implanted Si_1-xGe_x films. Journal of Applied Physics, 103(5): 053912.

Cite as: https://hdl.handle.net/21.11116/0000-000E-ACF2-F

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