Electron microscopy: Resolution and imaging contrast

Zhang, Siyuan

アイテム詳細

登録内容を編集ファイル形式で保存

一時保存へ追加

タグ情報を表示リリース履歴を表示詳細要約

公開

講演

Electron microscopy: Resolution and imaging contrast

MPS-Authors

/persons/resource/persons138618

Zhang, Siyuan
Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

External Resource

There are no locators available

Fulltext (restricted access)

There are currently no full texts shared for your IP range.

フルテキスト (公開)

公開されているフルテキストはありません

付随資料 (公開)

There is no public supplementary material available

引用

Zhang, S. (2023). Electron microscopy: Resolution and imaging contrast. Talk presented at DMG/DGK-AK9 Summer School “Advanced methods for the characterization of applied materials”, MPI-Kohlenforschung. Mülheim (Ruhr), Germany. 2023-09-26.

引用: https://hdl.handle.net/21.11116/0000-000E-0D0F-5

要旨

要旨はありません