Symmetry, Structural and Electronic Correlations in a Family of Bismuth-based 
Layered Materials

Carrillo-Aravena, E.; Consiglio, A.; Hessdörfer, J.; Friedrich, R.; Di Sante, D.; Ruck, M.

doi:10.1107/S2053273322093007

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Symmetry, Structural and Electronic Correlations in a Family of Bismuth-based Layered Materials

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Ruck, M.
Michael Ruck, Max Planck Fellow, Max Planck Institute for Chemical Physics of Solids, Max Planck Society;

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Carrillo-Aravena, E., Consiglio, A., Hessdörfer, J., Friedrich, R., Di Sante, D., & Ruck, M. (2022). Symmetry, Structural and Electronic Correlations in a Family of Bismuth-based Layered Materials. Acta Crystallographica A, 78(Supplement), E440-E441. doi:10.1107/S2053273322093007.

Cite as: https://hdl.handle.net/21.11116/0000-000E-2E63-0

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