Atom probe tomography for nanoscale characterization of functional materials

Jung, Chanwon

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Atom probe tomography for nanoscale characterization of functional materials

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Jung, Chanwon
Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Jung, C. (2023). Atom probe tomography for nanoscale characterization of functional materials. Talk presented at Global Photovoltaic Conference 2023, Session: CiS. II-VI & Chalcogenide compound-based cells and materials, Satellite-CiS-2. Gwangju, Repuplic of Korea. 2023-09-06 - 2023-09-08.

Cite as: https://hdl.handle.net/21.11116/0000-000E-4341-D

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