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Conference Paper

Characterization of the 166-Pixel Monolithic SDD TRISTAN Detector with Photons and Electrons in the KATRIN Monitor Spectrometer

MPS-Authors

Lechner,  P.
Max Planck Semiconductor Laboratory, Max Planck Society;

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Citation

Carminati, M., Siegmann, D., Urban, K., Edzards, F., Lechner, P., Fiorini, C. E., et al. (2023). Characterization of the 166-Pixel Monolithic SDD TRISTAN Detector with Photons and Electrons in the KATRIN Monitor Spectrometer. In 2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD) (pp. 1-1). doi:10.1109/NSSMICRTSD49126.2023.10338199.


Cite as: https://hdl.handle.net/21.11116/0000-000F-AFDD-4
Abstract
We report on the characterization of a monolithic array of 166 Silicon Drift Detectors (SDD) with integrated JFET. This high-density detection module (4 cm by 4 cm) was designed and assembled within the TRISTAN development of the KATRIN experiment for search of sterile neutrinos in the keV mass range by means of beta spectroscopy. The detector was commissioned in the KATRIN monitor spectrometer and was exposed both to X-ray photons (at 5.9 keV of Fe55) and electrons (at 32.2 keV energy of Kr83m) reaching state-of-the-art homogeneity and energy resolution: 157 eV and 352.8 eV FWHM respectively (with 2 us shaping time and -33°C cooling).