Structure and properties of tilt grain boundaries in Cu thin films

Dehm, Gerhard

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Structure and properties of tilt grain boundaries in Cu thin films

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Dehm, Gerhard
Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Dehm, G. (2022). Structure and properties of tilt grain boundaries in Cu thin films. Talk presented at Graduiertenkollegs GRK1896 „In situ microsopy with electrons, X-rays and scanning probes: Abschlusssymposium. Erlangen, Germany. 2022-06-23 - 2022-06-24.

Cite as: https://hdl.handle.net/21.11116/0000-000F-D17F-7

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